您当前所在位置: 首页 > 学者

韩雷

  • 90浏览

  • 0点赞

  • 0收藏

  • 0分享

  • 99下载

  • 0评论

  • 引用

期刊论文

Atomic diffusion properties in wire bonding

韩雷LI Jun-hui WANG Fu-liang HAN Lei DUAN Ji-an ZHONG Jue

Trans. Nonferrous Met. SOC. China 16(2006)463-466,-0001,():

URL:

摘要/描述

The lift-off characteristics at the interface of thermosonic bond were observed by using scanning electron microscope (JSM-6360LV). The vertical section of bonding point was produced by punching, grinding and ion-sputter thinning, and was tested by using transmission electron microscope (F30). The results show that the atomic diffusion at the bonded interface appears. The thickness of AdAI interface characterized by atomic diffusion is about 500 nm under ultrasonic and thermal energy. The fracture morphology of lift-off interface is dimples. The tensile fracture appears by pull-test not in bonded interface but in basis material, and the bonded strength at interface is enhanced by diffused atom fiom the other side.

【免责声明】以下全部内容由[韩雷]上传于[2006年09月15日 01时02分51秒],版权归原创者所有。本文仅代表作者本人观点,与本网站无关。本网站对文中陈述、观点判断保持中立,不对所包含内容的准确性、可靠性或完整性提供任何明示或暗示的保证。请读者仅作参考,并请自行承担全部责任。

我要评论

全部评论 0

本学者其他成果

    同领域成果