Photoluminescence (PL) of quantum dots embedded in high potential barriers is studied as functions of barrier thickness and temperature. With the increase of barrier thickness, both the strengthened two-dimensional electron gas (2DEG) structure and strongly localized electron wave functions can increase the carrier recombination. The optical properties of two different-barrier-thickness samples exhibit different characteristics with the decreased measurement temperatures. The PL recombination characteristic of the samples with the barriers adjacent to a Si-doping GaAs layer is different fromthat of samples with the barrier adjacent to an i-GaAs layer.