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汤庭鳌

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Tip Effects of Piezoelectric-Mode Atomic Force Microscope for L, ocal Piezoelectric Measurements of an SrBizTa2O9 Thin Film Guangda Hu*. Tingao TANG and Jianbm XU

汤庭鳌Guangda Hu*. Tingao TANG and Jianbm XU

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摘要/描述

Piezoclectric. Inode atomic force microscope was utilized to characterize a polycrystalline rBi2Ta209 thin fihn. It was found that a hysteresis loop can be obtained using a stiff tip with force constant of 48 N/m. On the other hand, the detected signal using a soft conducting tip with fl~rce constant of 3 N/m increases linearly with the increase Of the applied dc electric field·ln order to identify the types of the measurecl signals. we simulated a case, in which an Ideal piezoelectric hysteresis loop IS overlapped by a Iinear electrostatic signal. It was found that the coercive voltage Of the electrostatic-torce-coupled hysteresis loops decreases with the illcrease of the electrostatic signal. Furthermore, the electrostatic-force-coupled ptezoresponse can not reach a saturated value. This suggests that the signal measured usmg the soft Up IS aft electrostatic predominant signal, whtle the signal detected using the stifftip is a piezoelectric predominant response. [ DOt: 10.1143/JJAP. 41. 67931]

【免责声明】以下全部内容由[汤庭鳌]上传于[2005年06月22日 22时58分08秒],版权归原创者所有。本文仅代表作者本人观点,与本网站无关。本网站对文中陈述、观点判断保持中立,不对所包含内容的准确性、可靠性或完整性提供任何明示或暗示的保证。请读者仅作参考,并请自行承担全部责任。

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