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引用
期刊论文
A multi-wall carbon nanotube (MWCNT) relocation technique for atomic force microscopy (AFM) samples
Ultramicroscopy 103(2005)103-108,-0001,():
A simple relocation technique for atomic force microscopy (AFM), which takes advantage of multi-wall carbon nanotube (MWCNT), is used for investigating repeatedly the imaging of some specific species on the whole substrate with a high relocation accuracy of tens of nanometers. As an example of the application of this technique, TappingMode AFM ex situ study of the morphology transition induced by solvent treatment in a triblock copolymer thin film has been carried out.
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