成果题名:Microstrain in Al0.22Ga0.78N/GaN heterostructure studied by X-ray diffraction and scattering
作者: W. S. Tan a, b, H. L. Cai b, X. S. Wu b, S. S. Jiang b, W. L. Zheng c, Q. J. Jia c
成果题名:Microstrain in Al0.22Ga0.78N/GaN heterostructure studied by X-ray diffraction and scattering
作者: W. S. Tan a, b, H. L. Cai b, X. S. Wu b, S. S. Jiang b, W. L. Zheng c, Q. J. Jia c
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