全反射式傅立叶变换成像光谱仪调制度分析
首发时间:2007-11-07
摘要:介绍了一种基于分波前干涉结构的全反射式高分辨率傅立叶变换成像光谱仪系统结构,其中前置望远系统及干涉成像系统都采用了反射式光学元件。分析了光谱仪干涉光路及光程差的形成原理。运用物理光学方法详细分析了狭缝宽度、菲涅尔双面镜交角、面型精度等结构参数对干涉图调制度的影响,得出各参数对调制度影响的具体分析结果;并通过参数的优化组合整体分析了光谱仪系统的干涉条纹调制度。
关键词: 成像光谱仪 傅立叶变换成像光谱仪 全反射 菲涅尔双面镜 调制度
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Modulation Analysis of All-Reflective Fourier Transform Imaging Spectrometer
Abstract:We present an all-reflective Fourier transform imaging spectrometer (FTIS) with high resolution based on the principle of wavefront-splitting interference. The fore-optic configuration and the interference imaging system adopt reflective optical element. The basic interference principle of FTIS and optic system are introduced. Based on the physical optics method, we analyzed the affecting factors of interferogram modulation, including the width of entrance slit, angle of Fresnel double mirror, profile accuracy etc. Detailed analysis of affecting factors is given; besides, through the optimization combination of affecting factors, the global analysis of interferogram modulation is given.
Keywords: Imaging spectrometer Fourier transform imaging spectrometer All-reflective Fresnel double mirror Modulation
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No.1619589527119442****
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