A Novel BIST Scheme Using Test Vectors Applied by Circuit-under-Test Itself

• 1、School of Computer and Communication, Hunan University
• 2、School of Software, Hunan University

Abstract：This paper proposes a built-in-self-test scheme, in which the test vectors are applied by circuit-under- test (CUT) itself. In this method, CUT is not only regarded as the test object, but also a sort of available resource. By feedback connecting some of the CUT’s interior nodes to the primary inputs, our method can reduce the area overhead, shorten the application time, and implement at-speed testing. A “feedback node” search algorithm is presented for a given CUT and its test set in the paper. The experimental results on the ISCAS85 benchmark circuits and MinTest test set demonstrate that the proposed scheme not only can achieve almost 100 percent single stuck-at fault coverage, but also have an average 95% reduction in storage cost compared to Golomb compression methods, and an average 54% decrease in test data volume compared to LFSR reseeding.

Keywords： Built-In-Self-Test (BIST) Linear Feedback Shift Register (LFSR) Reseeding Golomb Codes