Evidence for the interface quantum trapping: Thermally-induced evolution of the Pd-Cu interface states
首发时间:2009-08-17
摘要:with mechanisms that are yet to be known. We show here with evidence that the “interface charge and energy quantum trapping due to bond order distortion and bond nature alteration” perturb essentially the Hamiltonian, atomic cohesive energy, and hence the related properties. Analysis the X-ray photoelectron emission of the thermally-induced evolution of Cu 2p and Pd 3d core-level energies at the Cu-Pd interface revealed that the Pd 3d and Cu 2p interfacial potential traps are 0.40 and 0.95 times deeper than those of the corresponding bulk constituents.
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Evidence for the interface quantum trapping: Thermally-induced evolution of the Pd-Cu interface states
Abstract:with mechanisms that are yet to be known. We show here with evidence that the “interface charge and energy quantum trapping due to bond order distortion and bond nature alteration” perturb essentially the Hamiltonian, atomic cohesive energy, and hence the related properties. Analysis the X-ray photoelectron emission of the thermally-induced evolution of Cu 2p and Pd 3d core-level energies at the Cu-Pd interface revealed that the Pd 3d and Cu 2p interfacial potential traps are 0.40 and 0.95 times deeper than those of the corresponding bulk constituents.
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Evidence for the interface quantum trapping: Thermally-induced evolution of the Pd-Cu interface states
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