The trigger mechanism and experiment of a three-dimensional quartz tuning fork probe
首发时间:2013-06-28
Abstract:In order to fulfill true three dimensional (3D) nano-measurement with sub-nano resolution and very low touch force by micro/nano coordinate measuring machine (Micro/nano CMM), a new 3D resonant trigger probe based on quartz tuning fork is proposed. In this probe, a quartz tuning fork together with a microball tip vibrates at its resonant frequency, and it is used as a sensing element of the trigger probe. The resonant vibrating parameters of the quartz tuning fork are highly sensitive to external 3D micro-forces. The distinguished feature of the probe is that it contacts with the sample surface in tapping-mode (TM) in Z direction while works in friction-mode (FM) in X and Y directions. The dynamic contact mechanism of the probe is analyzed according to interface mechanical theory, and mechanical models of the interactions between the microsphere tip and sample surface in X(Y) and Z directions are constructed respectively. According to the established motion equation of mechanical models, several mesoscopic interface forces which influences the probe are analyzed, and the corresponding mathematical simulations are given. By experiment, the probe has sub-nano resolutions in three dimensional directions, and repeatability of about 37 nm in X direction, 70.6 nm in Y direction and 41 nm in Z direction. The theoretical analysis and experimental results certified that this 3D resonant trigger probe can be used as a trigger probe for micro/nano CMM.
keywords: precision measurement technology and instruments three dimensional trigger probe quartz tuning fork interface mechanics resonant vibration micro/nano CMM
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石英音叉三维纳米测头触发机理及实验
摘要:微器件等的真三维纳米测量要求微纳米测头具有纳米量级的触发分辨率。不同于现有各种接触式、非接触式测头以及其他测头,本文利用谐振状态石英音叉的谐振参数(谐振幅值、谐振频率)对微力的高敏感特性构建了三维纳米触发定位测头。该种测头的显著特点是在Z向以轻敲模式接触,而在X、Y向以摩擦模式接触。文章从界面力学的角度分析了测头的动态接触机理,分别构建了X(Y)、Z向测球-试样表面纳米接触相互作用的力学模型。并根据建立的力学模型运动方程详细分析了范德华力、毛细力等介观尺度界面作用力对测头运动的影响并进行数学仿真。对构建的石英音叉三维纳米触发测头进行了三维力曲线重复性误差测试及数据分析。实验结果表明,X、Y单向重复性最大偏差分别为37nm、70.6nm,Z向单向重复性误差为41nm。理论分析与实验研究结果证明建立的三维纳米触发测头具有纳米级精确定位的可行性,可用于纳米尺度三维测量过程中三维方向上的单点高精度触发定位。
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