基于总线复用技术的低成本闪存测试方法
首发时间:2020-12-03
摘要:随着NAND闪存芯片的存储容量持续增加,测试时间所带来的成本增加问题越发严重,本文围绕着如何降低单位测试时间,以及如何降低测试成本这一核心问题进行展开。在对闪存测试项目、测试方法分析的基础上,提出了新的测试方法:结合自动化测试设备(ATE)并行同测方法,提出新的输入输出总线复用测试方法,从而缓解闪存测试时间长,测试成本高的问题。以特定测试机台T5773为例,重新设计软硬件将测试机的并行测试吞吐率增加一倍,并对本设计中的一些基本问题如失效处理问题进行了说明和解决办法汇总,最终极大减少了测试时间,降低了闪存测试成本。因此,此方法可以运用于大规模生产闪存中的成本控制。
关键词: NAND闪存测试 减少测试时间 总线复用 软硬件设计
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Low Cost NAND Testing Method Based On Bus Reuse
Abstract:Along with the continuously increasing of the NAND FLASH density, the cost increasing induced by test time increasing is getting worse and worse. In this article, regarding to the test time reduction, it detailed introduce how to reduce the test time so that to reduce the cost of testing. Based on the analysis of NAND structure, test items, test method, it brings up the new test method: on the ATE platform, raises new bus resue test method, and relieves the problem of long test ime and high test cost, successfully achieved the object. Based on the T5773, redesigned the hardware and software to double the testing duts in parallel, resolved the fail proceeding, greatly reduce the test time so that reduced the cost of NAND test. In summary, this method can be used for the cost control of NAND mass production.
Keywords: NAND Testing Test Time Reduction Bus Reuse Design of Software and Hardware
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