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期刊论文
Growth of epitaxial and oriented K(Ta 0.65 Nb o-35)O 3 thin films by sol-gel method
Journal of Crystal Growth 171(1997)314-317,-0001,():
Epitaxial and oriented K(Tao0.65Nb0.35)O3 thin films were prepared by the sol-gei method, using metalorganic compounds. The thin films were characterized by X-ray diffraction (XRD), and reflection high energy electron diffraction (RHEED). The mechanism of orientation of the K (Ta0.65Nb0.35) O3 films is discussed.
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