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期刊论文
ON THE CONTRIBUTION OF SUBINTERFACE MICROCRACKS NEAR THE TIP OF AN INTERFACE MACROCRACK TO THE J-INTEGRAL IN BIMATERIAL SOLIDS
Int. J. Engng Sci. 35 (4) 387-407. 1997,-0001,():
The J-integral analysis is performed for the plane problems of multiple subinterface microcracks near the tip of an interface macrocrack in bimaterial solids. The analysis starts from a general solution based on the "pseudo-traction" method which has been addressed thoroughly in homogeneous cases. The contribution to the J-integral induced from the subinterface microcracks is shown in a consistent relation with those induced from an interface macrocrack tip and the remote stress field. A new technique is developed to evaluate the second component (being expressed by J*2 in this paper) of the well-known Jk-vector of a subinterface crack for considering a contour enclosing the whole crack, which is necessary to evaluate the contribution to the J-integral arising from the subinterface microcracks. The consistency of the J-integral for numerical examples is proved, where two kinds of material combinations presented by Hutchinson et at. [ASME J. Appl. Mech., 1987, 54, 828-832] are considered. Some discussion and conclusions are then given which seem very useful in the investigation of microcrack shielding problems in bimaterial cases.
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