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期刊论文
ANALYSIS OF EXTENDING THE FIELD-OFVIEW OF REVERSE-MICROSCOPE IMAGING SYSTEM AT MILLIMETER-WAVELENGTHS
J. of Electromagn. Waves and Appl., Vol. 18, No.4, 469-479, 2004，-0001，（）：
In this paper, focal field of reverse-microscope imaging system at millimeter wavelengths is analyzed with ray-tracing method and Stratton-Chu vector diffraction integral formula. Calculations have been compared with experiments and agreement is found. Lens profile is optimized to reduce aberrations and extend field-of-view of the imaging system. The numerical results are presented to show the field distribution of the optimized imaging system.
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