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期刊论文

Leakage current analysis for In yGa12 yPzAs12 z/Al xGa12 xAs double heterostructure lasers

兰胜Sheng Lana) and Yuen-Chuen Chan Wan-Jing Xu De-Long Cui Cheng-Qing Yang and Hong-Du Liu

J. Appl. Phys. 80 (11), 1 December 1996,-0001,():

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摘要/描述

A band offset diagram for the heterojunction InyGa1-yPzAs1-z/AlxGa1-xAs based on the transitivity rule and our measured band offset for In0.5Ga0.5P/GaAs is given. A carrier leakage analysis is developed and explains the experimental observations in 670nm visible InyGa1-yPzAs1-z/AlxGa1-xAs double heterostructure (DH) lasers. The analysis based on the performance of this laser verifies that our band offset is more accurate than previous values. In contrast to GaAs/AlxGa1-xAs, InGaPAs/InP and InGaP/AlGaInP DH lasers, we found that the leakage of holes, rather than of electrons, is responsible for the high threshold current density of this type of laser.

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