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期刊论文
Phase transition related stress in ferroelectric thin films
Thin Solid Films 375(2000)15-18，-0001，（）：
An uneven distribution of stress in the thickness direction was introduced into Landau theory to investigate the critical behavior of phase transition of ferroelectric thin films. The Curie temperature TC was calculated to increase and decrease for compressive and tensile stress cases, respectively. The dispersion of phase transition was predicted. The diffusivity increased with stress, but showed a non-monotonic relation to film thickness. The results of the calculations were compared with some experimental results.
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