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Effect of thermal stability on magnetoresistance in NiO spin valve
J. Appl. Phys., Vol. 95, No.11, Part 2, 1 June 2004，-0001，（）：
The interface structure and magnetoresistance (MR) for the single spin valve (SV) of Co/Cu/Co structure with a NiO layer at the top or under the bottom were investigated. Glancing incident x-ray reflectivity and x-ray diffuse scatter studies show that the interface roughness of NiO on Co is much larger than that of Co on NiO. The large roughness may be one of the main factors of suppressing spin reflectivity. The interface between NiO and Co becomes more flat after annealing. Different temperature dependence of MR was observed for the top and the bottom SV. We attribute the above phenomena to the competition between the roughness and the exchange effects of the NiO/Co interface.
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