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张淳民

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期刊论文

Analysis of the modulation depth affected by the polarization orientation in polarization interference imaging spectrometers

张淳民Chunmin Zhang ab* Baochang Zhao b Bin Xiangli b Xinwei Zha c

Optics Communications 227(2003)221-225,-0001,():

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摘要/描述

The influence of the orientations of both polarizer and analyzer on modulation depth of spatially distributed interferograms for static polarization interference imaging spectrometer (SPIIS) is analyzed. A generally, theoretical relationship to determine the modulation depth of a SPIIS is derived. The special cases of maximum modulation depth (V=1) and the minimum modulation depth (V=0) are examined. Our results will provide a theoretical and practical guide for studying, developing and engineering polarization interference imaging spectrometers.

版权说明:以下全部内容由张淳民上传于   2009年05月26日 19时27分13秒,版权归本人所有。

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