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张建秋

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期刊论文

Sinewave Fit Algorithm Based on Total Least-Squares Method with Application to ADC Effective Bits Measurement

张建秋Jian Qiu Zhang Zhao Xinmin Hu Xiao and Sun Jinwei

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 46, NO.4, AUGUST 1997, 1026-1030,-0001,():

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摘要/描述

Sinewave fit is a fundamental task in many test and measurement systems. The characterizations of analog–digital converters and digital oscilloscopes are two examples. In this paper, we present a high-performance (i.e., high-precision and high-speed) algorithm to estimate the four parameters of a sinewave from a sample data record. By the use of trigonometric identity, we propose a frequency estimator that turns the nonlinear estimation problem into a linear one. Thus, the difficulty of the traditional nonlinear least-squares sinewave fit method is attenuated. The total least-squares method is used to estimate four parameters of a sinewave in order to minimize the estimation errors in the sense of l2 norm. Simulation results exhibit that the proposed method gives superior performance over traditional ones and achieves excellent estimation of the true resolution of the simulated ideal ADC. This new algorithm is noniterative and gives swift and consistent results.

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【免责声明】以下全部内容由[张建秋]上传于[2006年06月29日 18时37分24秒],版权归原创者所有。本文仅代表作者本人观点,与本网站无关。本网站对文中陈述、观点判断保持中立,不对所包含内容的准确性、可靠性或完整性提供任何明示或暗示的保证。请读者仅作参考,并请自行承担全部责任。

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