雷威
长期从事显示器件的研究和开发工作。
个性化签名
- 姓名:雷威
- 目前身份:
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学术头衔:
博士生导师
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学科领域:
微波技术
- 研究兴趣:长期从事显示器件的研究和开发工作。
雷威,1983-1987 在南京工学院电子工程系读本科;1987-1989 在东南大学电子工程系攻读硕士研究生;1990-1993 在东南大学电子工程系攻读博士研究生;1993-1997 任东南大学电子工程系讲师,副教授;1998.1-1999.1Philips公司访问研究;1999-至今任东南大学电子工程系副教授,教授,博士生导师。科研工作经历:长期从事显示器件的研究和开发工作,与同事们一起建立了完整的CRT显示器件设计软件,并且与国内企业,如上海永新彩色显象管有限公司、福地科技股份有限公司、华东电子集团等开展密切合作,研制了多个具有自主知识产权的新品。这对于打破国外公司长期的技术垄断具有重要意义。先后承担了多项东南大学与荷兰Philips公司的合作研究项目,研究成果受到董事会一致好评。目前承担了国家973项目‘新型场致发射平板显示和微显示的基础研究’二级子课题一项、博士点基金和东南大学基金项目各一项。参与国防科研工作,先后参与了数项预研项目、型谱项目以及国防重点实验室基金项目。近年来其科研工作的重点集中在纳米电子器件和平板显示器件研究。在场致发射平板显示器件的研究中,利用碳纳米管制备冷阴极阵列,并提出了一些很新颖的结构。这些研究成果具有一定的学术水平,并已经申请了数项发明专利和在国际核心刊物上发表了多篇学术论文。教学经历:先后承担了电子工程系《显示器件》、《电磁场理论》的教学工作。在教学工作中认真负责,教学效果良好,得到学生的好评,并获得学校教学一等奖、青年教师授课竞赛二等奖。
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成果数
14
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引用
【期刊论文】Field emission of vertically-aligned carbon nanotube arrays grown on porous silicon substrate
雷威
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-1年11月30日
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44浏览
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【期刊论文】Analysis of the emission performance of field emitter with Laplace interpolation method
雷威
,-0001,():
-1年11月30日
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【期刊论文】Study of the emission performance of carbon nanotubes
雷威, Lei Wei, a) Wang Baoping, Tong Linsu, Yin Hanchun, and Tu Yan Chang Chunzhu
J. Vac. Sci. Technol. B, 2000, 18(6):1-6,-0001,():
-1年11月30日
The carbon nanotube has good field emission properties, so it has been used as the electron source on the field emission display panel. To obtain a high emission current, the electric field at the tip of the nanotube must be large enough. This article studies the variation of electric field with different types of nanotubes. The emission current of the nanotube is also calculated for various geometrical parameters of nanotubes. From the simulation results, the influence of the geometrical parameters on the emission performance of nanotubes is studied.
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【期刊论文】A novel gate structure in large diagonal size printable CNT-FED
雷威, Qilong Wang, Wei Lei*, Xiaobing Zhang, Baoping Wang, Min Liu, Xuedong Zhou, Yunsong Di, Xiaoyan Ma
,-0001,():
-1年11月30日
In the normal gate CNT-FED, the gate electrode is used to modulate and address the electron beam. Some electrons may bombard on the gate electrode, thus the luminant efficiency of CNT-FED decreases. This paper proposes a new gate structure, which is the metal mesh with cone funnels. MgO film and MgF2 film are vaporized on the surface of the mesh and the funnels. When the primary electrons bombard on the gate electrode with initial energy, the secondary electrons and backscatters are generated. As results, more electrons can pass through the gate electrode and land on the anode. Consequently, the brightness of the novel triode structure CNT-FED can increase obviously. In the paper, we show the results of numerical simulation of the secondary electron emission process with Monte Carlo method. Some CNT-FED devices with the new type of gate structure are fabricated. The surface of the gate electrode is coated with MgO, MgF2 and SiO2 film, respectively. The results of emission experiments are also shown in this paper.
CNT-FED, Secondary electron emission, MgO, Monte Carlo method
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【期刊论文】Numerical analysis for charge accumulation on the chunnel of field emission devices
雷威, Min Liu, Xiaobing Zhang*, Wei Lei, Baoping Wang, Qilong Wang
Applied Surface Science 228(2004)277-284,-0001,():
-1年11月30日
Charge accumulations on the wall of the chunnels in field emission devices are analyzed with the Monte Carlo method. The chunnel's wall is dielectric, and secondary electrons are generated when electrons hit the chunnel's wall. Under the electron bombardment, the secondary emission induces charging on the wall. It is implied that in the field emission process, the upper part of the chunnel's inside wall is positively charged, while the lower part of the chunnel's inside wall and the chunnel's underside wall are negatively charged. Four models with different forms of chunnels are studied. We analyze the effect of charge accumulation in different models by comparing the potential distributions near the cathode and the current density distributions of the cathode, respectively. The results show that increasing the slope of the chunnels will reduce charge accumulations at the chunnel's underside wall. Also, the energy distributions of electrons arriving at the anode are analyzed, and it suggests that the chunnel's slope may decrease the ratio of primary electrons directly on the anode to all the electrons on the anode.
Charge accumulation, Secondary electron, Monte Carlo, Field emission
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【期刊论文】Perturbation of trajectory caused by small displacement of electrode
雷威, Lei Wei*, Yin Hanchun
Nuclear Instruments and Methods in Physics Research A 420(1999)369-379,-0001,():
-1年11月30日
In the design of devices containing beams of charged particles, it is helpful to know how the particle's trajectories will be modified by small displacement of electrodes. This paper describes a method to predict the perturbation of particle trajectories. In this methodology, the derivative of the potential is deduced from the results of finite element computation. The equation of motion is solved to calculate the perturbation of particle trajectories separately. An example of a perturbation trajectory in an electrostatic lens is presented.
Charged particle, Electrode, Displacement, Perturbation of potential, Finite element, Trajectory
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【期刊论文】Simulation of field emitter array in diode model
雷威, Lei Wei*, Wang Baoping, Yin Hanchun
Nuclear Instruments and Methods in Physics Research A 423(1999)213-222,-0001,():
-1年11月30日
In the application of field emitter arrays, it is useful to understand its emission performance. This paper calculates the electric field of a diode emitter array in three-dimensional space. From this calculation, the emission uniformity of a diode array is studied. The dependance of the tip-to-tip spacing and of the cathode-anode distance on the uniformity of the array is also analyzed. The pressure sensor based on the diode model is simulated. From the dependence of the emission current for different tip densities, the influence of the emission uniformity can be obtained. (1999 Published by Elsevier Science B.V. All rights reserved.
Field emitter array, Diode model, Three-dimensional space, Uniformity, Emission current, Pressure sensor
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【期刊论文】Analysis of the "dilemma effecta" in fifth-order deflection aberration
雷威, Xiaobing Zhang*, Hanchun Yin, Wei Lei, Kunxing Xue, Linsu Tong
Nuclear Instruments and Methods in Physics Research A 427(1999)404-407,-0001,():
-1年11月30日
In this paper, the coma of the fifth-order aberration at a large deflection angle has been analyzed by using multipole field theory. The dilemma effect exists in the comas of fifth-order aberration. The dilemma effect, whose value D3 is constant and independent of the 10-pole field, is the linear combination of coma aberrations. The coma of the fifth-order aberration is corrected by adjusting the 10-pole field distribution when Dr is zero or small. The factors that influence the dilemma effect have been calculated and analyzed.
Dilemma effect, Aberration, Picture tube
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