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【期刊论文】A COMPARISON BETWEEN THE INTERFACE PROPERTIES OF N2O-NITRIDED AND N2O-GROWN OXIDES
徐静平, J. P. XU, P. T. LAI and Y. C. CHENG
【期刊论文】Dynamic-Stress-Induced Enhanced Degradation of 1/f Noise in n-MOSFET's
徐静平, J. P. Xu, P. T. Lai, and Y. C. Cheng, Member, IEEE
【期刊论文】Gate dielectrics prepared by double nitridation in NOand N2O
徐静平, J.P. Xu, P.T. Lai, Y.C. Cheng
【期刊论文】GREATLY SUPPRESSED STRESS-INDUCED SHIFT OF GIDL IN N2O-BASED n-MOSFET's
徐静平, J. P. XU, P. T. LAI, L. HUANG, H. B. LO and Y. C. CHENG
【期刊论文】1/f noise in n-channel metal-oxide-semiconductor field-effect transistors under different hot-carrier stresses
徐静平, J. P. Xu, P. T. Lai, a) and Y. C. Cheng
【期刊论文】Determination of optimal insulator thickness for MISiC hydrogen sensors
徐静平, J.P. Xu a, P.T. Lai b, *, B. Han a, W.M. Tang b
【期刊论文】1/f Noise behaviors of NO-nitrided n-MOSFETs
徐静平, J.-P. Xu a, *, P.T. Lai b, Y.C. Cheng b
【期刊论文】Electrical properties of different NO-annealed oxynitrides
徐静平, J.P. Xu a, P.T. Lai b, *, Y.C. Cheng b
【期刊论文】Effects of Wet N2O Oxidation on Interface Properties of 6H-SiC MOS Capacitors
徐静平, P. T. Lai, J. P. Xu, and C. L. Chan
【期刊论文】Energy levels of interface states generated in n-MOSFETs by hot-carrier stresses
徐静平, Jing-Ping Xu a, *, P.T. Lai b, Y.C. Cheng b
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