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2005年02月24日

【期刊论文】Analysis of the "dilemma effecta" in fifth-order deflection aberration

雷威, Xiaobing Zhang*, Hanchun Yin, Wei Lei, Kunxing Xue, Linsu Tong

Nuclear Instruments and Methods in Physics Research A 427(1999)404-407,-0001,():

-1年11月30日

摘要

In this paper, the coma of the fifth-order aberration at a large deflection angle has been analyzed by using multipole field theory. The dilemma effect exists in the comas of fifth-order aberration. The dilemma effect, whose value D3 is constant and independent of the 10-pole field, is the linear combination of coma aberrations. The coma of the fifth-order aberration is corrected by adjusting the 10-pole field distribution when Dr is zero or small. The factors that influence the dilemma effect have been calculated and analyzed.

Dilemma effect, Aberration, Picture tube

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2005年02月24日

【期刊论文】A novel gate structure in large diagonal size printable CNT-FED

雷威, Qilong Wang, Wei Lei*, Xiaobing Zhang, Baoping Wang, Min Liu, Xuedong Zhou, Yunsong Di, Xiaoyan Ma

,-0001,():

-1年11月30日

摘要

In the normal gate CNT-FED, the gate electrode is used to modulate and address the electron beam. Some electrons may bombard on the gate electrode, thus the luminant efficiency of CNT-FED decreases. This paper proposes a new gate structure, which is the metal mesh with cone funnels. MgO film and MgF2 film are vaporized on the surface of the mesh and the funnels. When the primary electrons bombard on the gate electrode with initial energy, the secondary electrons and backscatters are generated. As results, more electrons can pass through the gate electrode and land on the anode. Consequently, the brightness of the novel triode structure CNT-FED can increase obviously. In the paper, we show the results of numerical simulation of the secondary electron emission process with Monte Carlo method. Some CNT-FED devices with the new type of gate structure are fabricated. The surface of the gate electrode is coated with MgO, MgF2 and SiO2 film, respectively. The results of emission experiments are also shown in this paper.

CNT-FED, Secondary electron emission, MgO, Monte Carlo method

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2005年02月24日

【期刊论文】Numerical analysis for charge accumulation on the chunnel of field emission devices

雷威, Min Liu, Xiaobing Zhang*, Wei Lei, Baoping Wang, Qilong Wang

Applied Surface Science 228(2004)277-284,-0001,():

-1年11月30日

摘要

Charge accumulations on the wall of the chunnels in field emission devices are analyzed with the Monte Carlo method. The chunnel's wall is dielectric, and secondary electrons are generated when electrons hit the chunnel's wall. Under the electron bombardment, the secondary emission induces charging on the wall. It is implied that in the field emission process, the upper part of the chunnel's inside wall is positively charged, while the lower part of the chunnel's inside wall and the chunnel's underside wall are negatively charged. Four models with different forms of chunnels are studied. We analyze the effect of charge accumulation in different models by comparing the potential distributions near the cathode and the current density distributions of the cathode, respectively. The results show that increasing the slope of the chunnels will reduce charge accumulations at the chunnel's underside wall. Also, the energy distributions of electrons arriving at the anode are analyzed, and it suggests that the chunnel's slope may decrease the ratio of primary electrons directly on the anode to all the electrons on the anode.

Charge accumulation, Secondary electron, Monte Carlo, Field emission

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2005年02月24日

【期刊论文】Perturbation of trajectory caused by small displacement of electrode

雷威, Lei Wei*, Yin Hanchun

Nuclear Instruments and Methods in Physics Research A 420(1999)369-379,-0001,():

-1年11月30日

摘要

In the design of devices containing beams of charged particles, it is helpful to know how the particle's trajectories will be modified by small displacement of electrodes. This paper describes a method to predict the perturbation of particle trajectories. In this methodology, the derivative of the potential is deduced from the results of finite element computation. The equation of motion is solved to calculate the perturbation of particle trajectories separately. An example of a perturbation trajectory in an electrostatic lens is presented.

Charged particle, Electrode, Displacement, Perturbation of potential, Finite element, Trajectory

上传时间

2005年02月24日

【期刊论文】Simulation of field emitter array in diode model

雷威, Lei Wei*, Wang Baoping, Yin Hanchun

Nuclear Instruments and Methods in Physics Research A 423(1999)213-222,-0001,():

-1年11月30日

摘要

In the application of field emitter arrays, it is useful to understand its emission performance. This paper calculates the electric field of a diode emitter array in three-dimensional space. From this calculation, the emission uniformity of a diode array is studied. The dependance of the tip-to-tip spacing and of the cathode-anode distance on the uniformity of the array is also analyzed. The pressure sensor based on the diode model is simulated. From the dependence of the emission current for different tip densities, the influence of the emission uniformity can be obtained. (1999 Published by Elsevier Science B.V. All rights reserved.

Field emitter array, Diode model, Three-dimensional space, Uniformity, Emission current, Pressure sensor

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  • 雷威 邀请

    东南大学,江苏

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