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2006年12月06日

【期刊论文】Scratch-Resistant Improvement of Sol-Gel Derived Nano-Porous Silica Films

吴广明, JUE WANG, GUANGMING WU, JUN SHEN, TIANHE YANG, QINYUAN ZHANG, BIN ZHOUAND ZHONGSHENG DENG

Journal of Sol-Gel Science and Technology 18, 219-224, 200,-0001,():

-1年11月30日

摘要

Scratch-resistance of sol-gel derived nano porous silica films were studied. The thin films were preparedwith a dip-coating method from both one-step and two-step catalyzed silica sols, and treated in a mixture gas ofammonia andwater vapour afterwards. The thin films were characterized by using Atomic Force Microscope (AFM), ellipsometer, Fourier-transform Infrared Spectroscope (FTIR), respectively. Experimental results have shown thatthe two-step catalysis remarkably improves strength of the films, and abrasion-resistance and adhesion of the silicafilms were further increased after the mixture gas treatment. It is attributed to the cross-linking of silica particlesin the sols by randomly branched or/and entangled linear chains and more Si O Si bonds formed by the mixturegas treatment.

sol-gel process,, silica film,, AFM,, refractive index

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2006年12月06日

【期刊论文】Preparation and electrochemical properties of vanadium pentoxideaerogel film derived at the ambient pressure

吴广明, Kun Xiao*, Guangming Wu, Jun Shen, Debin Xie, Bin Zhou

,-0001,():

-1年11月30日

摘要

gel materials has received much significant attention recently as it can be used as highly promising cathodic materials for Li-ionbatteries. A novel kind of V2O5 aerogel materials, ambient dried V2O5 aerogel films were reported in this paper. The films were deposited by thedip-coating method and dipped into acetone and cyclohexane by turn to exchange the solvent in the films. Atomic force microscopy (AFM), X-raydiffraction topography (XRD), ellipsometry, and electrochemical measurements were employed to characterize the aerogel films. The porosity ofthe aerogel films is 56%, 16% higher than that of the xerogel films when dried at 120℃. The aerogel films have the higher capacity, as well asbetter reversibility than those of the xerogel films. The improvement of the capacity can be ascribed to the increase of porosity as well as the porediameters after the solvent exchange.

Thin films, Atomic force microscopy (, AFM), , X-ray diffraction topography (, XRD), , Electrochemical properties

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2006年12月06日

【期刊论文】A novel route to control refractive index of sol-gel derivednano-porous silica films used as broadband antireflective coatings

吴广明, Guangming Wu a, *, Jue Wang a, Jun Shen a, Tianhe Yang a, Qinyuan Zhang a, Bin Zhou a, Zhongsheng Deng a, Bin Fan b, Dongping Zhou b, Fengshan Zhang b

Materials Science and Engineering B78 (2000) 135-139,-0001,():

-1年11月30日

摘要

A relatively new method to adjust refractive index of nano-porous silica films rapidly and continuously is reported. The thinfilms were prepared with the base:acid two-step catalytic sol-gel process and the dip-coating method. The structure, reflectivespectra and refractive index of the films were analyzed with TEM, AFM, SEM, spectrophotometer, and ellipsometery, respectively. The experimental results have shown that the base: acid two-step catalysis can adjust the refractive index of thenano-porous silica films from 1.18 to 1.42 rapidly and continuously. And a broadband antireflective coating made with themethod has very low reflectance. The average reflectance of the coated glass in the solar energy spectrum decreases to 1.5% from 7% of the glass.

Sol-gel process, Silica coatings, Nano-porous structure, Antireflectance

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2006年12月06日

【期刊论文】SiO2气凝胶薄膜常压制备与强化研究*

吴广明, 鲁鸿雁, 王珏, 沈军, 周斌, 张勤远, 邓忠生

物理学报,2001,51(1):105~110,-0001,():

-1年11月30日

摘要

采用溶胶-凝胶技术,结合碱性催化和低表面张力溶剂交换以及非活性C地基团置换修饰,在常压条件下成功 地制备了孔隙率为77%、折射率为112纳米多孔SiO2气凝胶薄膜采用氨和水蒸气混合气体热处理技术提高薄膜 的耐磨性、附着力等力学特性使用透射电镜(TEM)、扫描电镜(SEM)分别观察了溶胶的颗粒结构和薄膜表面形貌 应用傅里叶转换红外光谱仪(FTIR)研究了薄膜经表面基团修饰前后的红外吸收光谱以及后处理对薄膜红外蛐(TO2)吸收峰位置和半宽度的影响采用椭偏仪测量薄膜的厚度和折射率耐摩擦和附着力测试表明:混合气体热 处理显著地增强了SiO2气凝胶薄膜纳米结构薄膜结构增强归因于混合气体热处理产生的s-01颗粒司更多的S-0-Si键连接。

气凝胶薄膜,, 溶胶-凝胶技术,, 纳米多孔结构

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2006年12月06日

【期刊论文】实验条件对纳米多孔SiO2薄膜结构及特性的影响*

吴广明, 王珏, 沈军, 杨天河, 张勤远, 周斌, 邓忠生, 范滨, 周东平, 张风山

物理学报,2001,50(1):175~181,-0001,():

-1年11月30日

摘要

报道了实验制备条件对纳米多孔SiO2薄膜结构、折射率、红外吸收、xPs等特性的影响,尤其是报道了一种新的快速、方便、有效实现纳米多孔SiO2薄膜折射率连续调节的方法在溶胶-凝胶基础上,采用碱、酸一步法以及碱/酸两步法和浸渍镀膜技术制备了纳米多孔SiO2薄膜使用原子力显微镜、扫描电镜、xPs、傅里叶红外光谱仪、椭偏仪等方法测量和分析了薄膜的特性实验结果给出从碱一步法、碱/酸两步法、到酸一步法形成的薄膜,SiO2颗粒变小,孔隙率降低,折射率从118连续增加到1.41;s-2。峰向高束缚能方向移动,并接近块体的值;红外吸收光学模m。的频率向低波数方向移动,揭示了s-0-s-键角的不断降低这些结果表明,碱/酸两步法能方便、有效地连续控制纳米多孔SiO2薄膜的结构;实验条件对薄膜特性的影响起因于纳米多孔结构改变引起的s-凸结构变化

溶胶-凝胶技术,, SiO2薄膜,, 纳米多孔结构

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    同济大学,上海

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