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【期刊论文】Nanostructure Study of TiO2 Films Prepared by Dip Coating Process
吴广明, S.M. Attia, Jue WANG, Guangmin WU, Jun SHEN AND Jianhua MA
,-0001,():
-1年11月30日
The microstructure properties of the sol-gel derived TiO2 films were studied by the atomic force microscopy (AFM). The films were prepared by dip coating process. The optical properties of the films were explained on the basis of the microstructure of the films
Atomic force microsconv TiO2 microscopy,, 1iO2 thin film,, Sol-gel process
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吴广明, Wu Guangming, Wang Jue, Shen Jun, Yang Tianhe, Zhang Qinyuan, Zhou Bin, Deng Zhongsheng
,-0001,():
-1年11月30日
new method to strengthen nano porous broadband anti-reflectance (AR) silica films is described. Silicasols were made from TEOS with a base/acid two-step catalytic process. Properties of silica films deposited witha dip-coat method are characterized with AFM, SEM, spectrophotometer and abrasion test. Experimental resultsshow that the average reflectance ofa glass coated with the nano porous silica films is less than 1% in the visibleregion; and that the two-step catalysis obviously strengthens the films. Finally, the strengthening mechanism ofthe films is discussed.
Sol-Gel Process, Silica Films, Anti-reflectance, Nano Porous Structure
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吴广明, Guangming Wu a, *, Jue Wang a, Jun Shen a, Tianhe Yang a, Qinyuan Zhang a, Bin Zhou a, Zhongsheng Deng a, Bin Fan b, Dongping Zhou b, Fengshan Zhang b
Materials Science and Engineering B78 (2000) 135-139,-0001,():
-1年11月30日
A relatively new method to adjust refractive index of nano-porous silica films rapidly and continuously is reported. The thinfilms were prepared with the base:acid two-step catalytic sol-gel process and the dip-coating method. The structure, reflectivespectra and refractive index of the films were analyzed with TEM, AFM, SEM, spectrophotometer, and ellipsometery, respectively. The experimental results have shown that the base: acid two-step catalysis can adjust the refractive index of thenano-porous silica films from 1.18 to 1.42 rapidly and continuously. And a broadband antireflective coating made with themethod has very low reflectance. The average reflectance of the coated glass in the solar energy spectrum decreases to 1.5% from 7% of the glass.
Sol-gel process, Silica coatings, Nano-porous structure, Antireflectance
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吴广明, 马建华, 程银兵, 孙骐, 王俊玲, 沈军, 王珏
物理化学学报,2001,17(21):1112~1116,-0001,():
-1年11月30日
以正硅酸乙酯(TEOS)为有机醇盐前驱体,采用溶胶凝胶技术,通过酸/碱二步法控制实验条件,结合三甲基氯硅烷(TMCS)对腔粒表面的修饰过程,制备出结构可控的疏水型SiO2薄膜,采用椭偏仪、FTTR接触角测试仪、SEM等对薄膜的折射率、红外特性,接触角以及表面形貌等进行了测量研究结果表明,疏水型SiO,薄膜的折射率在1.33~1.18之间连续可调:SiO2胶粒表面的亲水性-OH中的H已部分被非活性-Si(CH3),基团取代:接触角由表面未修饰膜的40左右增加到表面修饰膜的120°左右。
溶胶-凝胶 SiO2表面修饰 疏水薄膜
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【期刊论文】Review on Sol-Gel Derived Coatings: Process, Techniques and Optical Applications
吴广明, S.M. Attia.), due WANGl), Guangming WU), dun SHEN) and Jianhua MA)
,-0001,():
-1年11月30日
Sol-gel process is one of the simplest techniques to manufacture thin films. The quality of the prepared films depends on the parameters of the sol-gei process and the used technique for deposition. A great variety of the sol-gel derived films have been prepared for different applications. We present a review on the sol-gel derived coatings. The description of the process is introduced in details. Different sol-gel deposition techniques are mentioned. The optical applications of the sol-gel derived coatings are reviewed.
Sol-gel process,, Coating,, Thin fihn
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