β-氧化镓高温肖特基势垒二极管的研究
首发时间:2024-05-06
摘要:电子电力器件以其耐高压、高功率、快速开关性能而被广泛研究与应用。随着深空探测、军事战备、火灾火情防控等领域的探索,对于能在高温恶劣环境稳定工作的功率器件的研究成为重要课题。本文以氧化镓材料为基础,制备了垂直与水平两种结构的肖特基势垒二极管,分别在高温环境中研究了在正反向偏置下器件的电学特性。器件的表现出良好的整流特性,高温下正向开启电压小于1 V,500 K高温下反向击穿电压可达-189 V。器件具有良好的正向开启特性与反向耐击穿的能力,高温引起了器件载流子能量、肖特基势垒宽度以及杂质散射的变化,从而导致随着温度升高器件的正向开启电压降低、导通电阻增大的现象。同时,高温也使得器件的反向漏电流水平上升,最终导致了器件击穿电压随温度升高而降低的过早击穿现象。
关键词: 微电子与固体物理学 氧化镓 肖特基势垒二极管 整流特性 高温
For information in English, please click here
Study of High-temperature Schottky Barrier Diodes based on β-gallium oxide
Abstract:Electronic power devices are widely researched and applied nowadays due to the high voltage resistance, high power and fast switching performance. With the exploration of deep space exploration, military developments, fire prevention and other fields, the study of power devices that can work stably in high temperature and harsh environments has become an important topic. In this paper, two structures of Schottky barrier diodes, vertical and horizontal, were prepared based on gallium oxide, and the electrical characteristics of the devices under forward and reverse bias were investigated in high temperature environment. The devices show good rectification characteristics, with forward turn-on voltage less than 1 V at high temperature, and reverse breakdown voltage up to -189 V at 500 K. The devices show acceptable forward turn-on characteristics and reverse breakdown resistance, and the high temperature induces changes of the carrier energy, Schottky barrier width, and impurity scattering of the devices, which leads to a decrease in the forward Von and an increase in the Ron of the devices as the temperature rises. Meanwhile, the high temperature also increases the reverse leakage currents of the devices, which ultimately leads to the premature breakdown phenomenon where the breakdown voltage of the device decreases with increasing temperature.)
Keywords: Microelectronics and Solid State Electronics Gallium oxide Schottky barrier diode Rectification characteristics High temperature
基金:
引用
No.****
动态公开评议
共计0人参与
勘误表
β-氧化镓高温肖特基势垒二极管的研究
评论
全部评论0/1000