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期刊论文

Analysis of ferrite waveguide devices by use of the edge FEM combined with the SOC technique

陈如山R.S. CHEN*† D.X. WANG†and EDWARD K.N. YUNG‡

INT. J. ELECTRONICS, 2002, VOL. 89, NO.10, 771-790,-0001,():

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摘要/描述

In this paper, ferrite waveguide devices are analysed by use of the edge-based vector finite element method combined with the short-open calibration (SOC) technique. The formulation with both permittivity and permeability tensors for tetrahedral vector elements is analytically given in terms of the electric field. The SOC technique is directly accommodated in the FEM algorithm and used to truncate the computational domain. The SOC technique removes or separates unwanted parasitics obtained by the approximation of the impressed voltage source and the inconsistency between different simulations. Several types of ferrite waveguide device are analysed and the results are compared with those of the available publications. A good agreement is observed between them.

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