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蒋庄德

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期刊论文

High temperature and frequency pressure sensor based on silicon-on-insulator layers

蒋庄德YL Zhao LB Zhao and ZD Jiang

Meas. Sei. Technol. 17(2006)519-523,-0001,():

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摘要/描述

Based on silicon on insulator (SOI) technology, a novel high temperature pressure sensor with high frequency response is designed and fabricated, in which a buried silicon dioxide laycu in the silicon material is developed by the separation by implantation of oxygen (SIMOX) techonology. This layer can isolate leak currents between the top silicon layer for the detecting circuit and body silicon at a tcnpcratuec of about 200℃. In addition, the tcchnology of silicon and glass bonding is used to create a package of the sensor without internal strain. A structural model and test data from the sensor are presented. The experimental rcsults showed that this kind of sensor posscsscs good static performance in a high temperature environment and high frequency dynamic characteristics, which may satisfy the pressure measurement demands of the oil industry, aviation and space, and so on.

【免责声明】以下全部内容由[蒋庄德]上传于[2006年09月26日 00时56分27秒],版权归原创者所有。本文仅代表作者本人观点,与本网站无关。本网站对文中陈述、观点判断保持中立,不对所包含内容的准确性、可靠性或完整性提供任何明示或暗示的保证。请读者仅作参考,并请自行承担全部责任。

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