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引用
期刊论文
VLSI Yield Optimization Based on the Redundancy at the Sub-Processing-Element Level
IEICE TRANS. INF & SYST., VOL. E84-D, NO. 11, NOVEMBER 2001,-0001,():
An optimal allocation model for the subprocessing-element (sub-PE) level redundancy is developed, which is solved by the genetic algorithms. In the allocation model, the average defect density D and the parameter δ are also considered in order to accurately analyze the element yield, where δ is defined as the ratio of the support circuit area to the total area of a PE. When the PE’s area is imposed on the constraint, the optimal solutions of the model with different D and δ are calculated. The simulation results indicate that, for any fixed average defect density D, both the number of the optimal redundant sub-circuit added into a PE and the PE’s yield decrease as δ increases. Moreover, for any fixed parameter δ, the number of the optimal redundant sub-circuit increases, while the optimal yield of the PE decreases, as D increases.
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