Although pulsed laser deposition (PLD) is one of the most reliable techniques for fabricating YBa2Cu30x (YBCO) thin films with high critical current density (Jc), metal organic decomposition (MOD), inchding the trifluoroacetate (TFA) process, is attracting more interest because of its potential for scale-up and cost-effectiveness. In general, PLD samples have higher Jc values than those of TFA samples. In this study, we deposited YBCO films on LaAIO3 single-crystal substrates by TFA and PLD, respectively. Performance of the two samples was compared to investigate possible causes that lead to the different Jc values. In-plane and out-of-plane texture was evaluated quantitatively by phi and omega scan, respectively. The FWHMs of phi and omega scans for the TFA sample were comparable to those of the PLD sample, indicating that TFA films follow the substrate texture precisely. Raman spectra were measured to estimate grain connectivity, texture, and second-phase formation. The properties of the samples are almost identical, except for the intensity of the BaCuO2 Raman peaks. Microstructure observation by SEM showed that TFA films were generally more porous and smaller-grained than PLD samples. Considering these results, the difference in Jc values between TFA and PLD samples (1.3 and 3MA/cm2, respectively) in this experiment is partly attributed to the more porous mi-crostructure of the TFA samples.