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期刊论文

Optical Emission from Excess Si Defect Centers in SiNanostructures

吴兴龙X. L.Wu* S. J. Xiong G.G. Siu G. S. Huang Y. F. Mei Z.Y. Zhang S. S. Deng and C. Tan

PHYSICAL REVIEW LETTERS VOLUME 91, NUMBER 15 10 OCTOBER 2003,-0001,():

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摘要/描述

Four groups of Si nanostructures with and without-SiC nanocrystals were fabricated for clarifying the origin of a blue emission with a double-peak structure at 417 and 436nm. Spectral analyses and microstructural observations show that the blue emission is related to the existence of excess Si atoms in these Si nanostructures. The energy levels of electrons in Si nanocrystals with vacancy defects formed from the excess Si atoms are calculated and the characteristics of the obtained density of states coincide with the observed double-peak emission. The present work provides a possible mechanism of the blue emission in various Si nanostructures.

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