The microstructure of fine particles plays a key role on the properties of materials made from fine particles. In order for the microstructure of fine particles to be available for examination by TEM, a nano-scaled thin film which is penetrable by electron beam must first be cut from the fine particle. This paper describes the technique of metal en-capsulation for cutting such thin films from fine particles. First, place a monolayer of fine particles on a polished metal strip (Fig. 1, A). Then encapsulate the fine particles on the metal strip by Ion Deposition Technique (Fig. 1, B). Polish both surfaces of the encapsulated particle layer until the fine particles are sufficiently exposed for obser-vation from both sides. By now a micron-scaled thin film is obtained (Fig. 1, C). Finally, with the help of Ion Beam Thinner, the micron-scaled thin film is further reduced to a nano-scaled film which is penetrable by electron beams and thus ready for examination by TEM. Following are examples of using this technique.