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期刊论文
Scanning force microscopy investigation of the Pb
APPLIED PHYSICS LETTERS VOLUME 81, NUMBER 17 21 OCTOBER 2002,-0001,():
We report on a novel approach for the investigation of the Pb ZrxTi12x)O3/Pt interface applying scanning force microscopy techniques. Ferroelectric samples PZT film/Pt/SiO2/Si) were polished at a shallow angle (~6.1°) thereby enlarging the film cross section from a 430nm film thickness to a width of more than 4mm. Piezoresponse force microscopy and Kelvin probe force microscopy were applied in order to deduce the dielectric polarization P and local potential distribution over the full cross section. We clearly observe a transition layer with a thickness of; 240nm which manifests itself both in a gradual decrease of the piezoresponse signal as a function of film thickness and in a corresponding variation of the surface potential. Furthermore, after polarization reversal due to a dc voltage applied to the tip, a different retention behavior was observed within the transition layer. The results are tentatively attributed to negatively charged defects accumulated at the PZT/Pt interface.
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