中国科技论文在线

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2005年03月04日

【期刊论文】基于布里渊增益的单端分布式光纤传感技术

胡小唐，胡晓东

，-0001，（）：

-1年11月30日

摘要

本文对基于布里渊增益的分布式光纤传感技术进行了理论分析，并针对一些特殊应用领域提出了一种能够以单端方式工作的新型传感结构。光纤端面的菲涅尔反射光和信号检测的时序控制在该结构中被应用，以实现温度或应变的测量。初步的实验也表明该方案是可行的。

分布式光纤传感技术,，布里渊增益,，布里渊频移,，菲涅尔反射

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2005年03月04日

【期刊论文】New Scanning Mode of Scanning unneling Microscopy

胡小唐， Fu Xing *， Wei Xiaolei， Li Mengchao， Hu Xiaotang

2nd International Symposium on Instrumentation Science and Technology Aug. 18～22, 2002, Jinan. China，-0001，（）：

-1年11月30日

摘要

The coincidence scanning mode has been developed by analyzing feedback equations for constant-current scanning and imaging surfaces with atomic resolution with the new mode.This mode can be almost applied to the feedback control of all sorts of SPM instruments,and reduces the scanning time to 60%.

STM,， scanning mode,， coincidence scanning

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2005年03月04日

【期刊论文】Calibration of Spring Constant of an AFM Cantilever for the Study on Ligand-Receptor Interaction

胡小唐， Yi Ran*a， Li Yanning a， Wang Yanxia a， Fu Xing a， Hu Xiaotang a

2nd International Symposium on Instrumentation Science and Technology Aug. 18～22, 2002, Jinan. China，-0001，（）：

-1年11月30日

摘要

A new way of calibrating the spring constant by measuring both resonant frequencies of the cantilever in air and in liquid is presented. By relating the two frequency values, the density and viscosity of the liquid, the precise spring constant value can be obtained. As a ondestructive method and without other apparatus, it is an easy way of cantilever calibration especially suitable for the study of ligand-receptor interaction and using AFM in aqueous as well.

AFM cantilever,， force-separation curve,， resonant frequency,， spring constant.，

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2005年03月04日

【期刊论文】Nanoscale oxide structures induced by dynamic electric field on Si with AFM

胡小唐， Xiaodong Hu*， Tong Guo， Xing Fu， Xiaotang Hu

Applied Surface Science 217(2003)34-38，-0001，（）：

-1年11月30日

摘要

Nanoscale oxide structures are very important for the study of functional nanodevices. Local oxidation induced by electric field with scanning probe microscopy is a promising method. Some oxide lines and dots on Si surface were fabricated using conductive atomic force microscope in this paper. Nanoscale oxide lines induced by dc voltages exhibit the characteristic of single peak, but the hollow structures with higher aspect ratio are observed under the effect of square wave voltages. We present the hollow structures result from the finite diffuse speed and concentration of oxygen ion, and the higher aspect ratio results from the effect of dynamic electric field in the conductor-nonconductor-semiconductor junction formed in the course of fabrication.

AFM， Oxide structure， Nanofabrication， Dynamic electric field

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