A quantum dot (QD) can capture and emit carriers, the behavior of which is similar to that of a giant trap, and stacked QDs with a size-controlled growth show a strong tendency to align vertically. The discrete energy level properties of the self-assembled vertically stacked InAs QDs in Al0.5Ga0.5As are studied by means of deep level transient spectroscopy (DLTS) and photoluminescence (PL) spectroscopy. The DLTS measurement displays the spectra of hole and electron discrete energy levels as positive and negative peaks, respectively, which illustrates that the DLTS is a capable tool to study the optical and electrical properties of the QDs. The PL emission peaks are found to completely correspond to the DLTS signals.

Quantum dots (QDs), which capture and emit carriers like a giant trap, are studied using deep level transient spectroscopy (DLTS). The electrons and holes in the QDs are emitted from the relevant energy levels to the conduction and valence bands, respectively, of the barrier layers with increasing temperature. The thermal emission energies from the QDs are related to their initial energy levels. In this paper, five-period vertically stacked InAs QDs in the barrier layers of a field-effect type structure are measured. The results agree well with capacitance-voltage and photoluminescence measurements. In addition, the dependence of DLTS signal on the pulse voltage and light illumination is presented. The results prove that DLTS is a powerful tool for the study of the electronic structure of QDs.