Ni50Mo50合金样品是由纯晶态的Ni和Mo粉末混合，用机械合盘化法制备的国。用中子衍射技术对该样品的非晶化过程进行了研究，观测到了非晶的Ni-Mo的存在，得到了其径向分布函数RDF(r)和一些结构参数。讨论了非晶化的机理，并指出了机械合金化的三种非品化反应类型的划分具有某种局限性。

在x射线发现一百周年之际，本文回顾了x射线发现的历史及其重要意义，简要评述了l00事年来x射线的研究和应用的光辉历程及其对现代科学技术的发展所产生的巨大影响，介绍了x射线研究的一些最新进展，展望了二十一世纪x射线研究和应用的美好前景。

在成功地外延生长超导、铁电、铁磁等多种性质的钙钛矿结构氧化物薄膜的基础上，讨论影响氧化物薄膜外延生长的一些因素。考虑到相形成和薄膜生长动力学，在利用脉冲激光淀积法外延生长氧化物薄膜中衬底温度是十分重要的工艺参数。衬底温度对成相和生长薄膜的取向都有影响。考虑到薄膜是首先在衬底表面成核、成相并生长。因此衬底材料晶格的影响是不容忽视的。观察到衬底材料对薄膜外延生长温度的影响。在适当的工艺条件下，利用低温三步法工艺制备得到有很强织构的外延薄膜。这突出表明界面层的相互作用对钙钛矿结构薄膜的取向有着相当大的影响。

Biaxially textured yttria-stabilized zirconia (YSZ) films were grown on mechanically polished Hastelloy C276 (HC) substrates by ion-beamassisted deposition and electron-beam evaporation. The surface root-mean-square (RMS) roughness of the polished HC substrates was ≈3 nm, as measured by atomic force microscopy (AFM). A water-cooled sample stage was used to hold the substrate temperature below 100◦C during deposition. RMS roughness of≈3.3 nm was measured on the deposited YSZ films by AFM. X-ray pole figures were conducted for texture analysis; in-plane texture measured from YSZ (111) φ-scan FWHM was 13.2℃ and out-of-plane texture from the YSZ (002) ω-scan FWHM was 7.7℃. An≈10 nm thick CeO2 buffer layer was deposited on the YSZ film at 800℃ before YBCO films were ablated by pulsed laser deposition at 780℃ in a 250 mTorr flowing oxygen environment. Good in-plane texture with FWHM≈7℃was observed in YBCO films. Tc=90K, with sharp transition, and transport Jc of≈2.2 ×106 A cm−2 were observed in a 0.5μm thick, 5mmwide, and 1cm long sample at 77K in self-field.

脉冲激光制膜是近年来发展的富有希望的制膜新技术。本文简要介绍了脉冲激光制膜技术的原理、特点和优势以及在功能薄膜研究中的应用。