Biaxially textured magnesium oxide (MgO) films deposited by inclined-substrate deposition (ISD) are desirable for rapid production of high-quality template layers for YBCO-coated conductors. High-quality YBCO films were grown on ISD MgO buffered metallic substrates by pulsed laser deposition (PLD). Columnar grains with a roof-tile surface structure were observed in the ISD MgO films. X-ray pole figure analysis revealed that the (002) planes of the ISD MgO films are tilted at an angle from the substrate normal. A small full-width at half maximum (FWHM) of≈9◦ was observed in the φ-scan for ISD MgO films deposited at an inclination angle of 55◦. In-plane texture in the ISD MgO films developed in the first≈0.5μm from the substrate surface, and then stabilized with further increases in film thickness. Yttria-stabilized zirconia and ceria buffer layers were deposited on the ISD MgO grown on metallic substrates prior to the deposition of YBCO by PLD. YBCO films with the c-axis parallel to the substrate normal have a unique orientation relationship with the ISD MgO films. An orientation relationship of YBCO 100 MgO 111 and YBCO 010 MgO 110 was measured by x-ray pole figure analyses and confirmed by transmission electron microscopy. A Tc of 91 K with a sharp transition and transport Jc of 5.5×105 A cm−2 at 77 K in self-field were measured on a YBCO film that was 0.46 μm thick, 4 mmwide and 10 mm long.

Biaxially textured yttria-stabilized zirconia (YSZ) films were grown on mechanically polished Hastelloy C276 (HC) substrates by ion-beamassisted deposition and electron-beam evaporation. The surface root-mean-square (RMS) roughness of the polished HC substrates was ≈3 nm, as measured by atomic force microscopy (AFM). A water-cooled sample stage was used to hold the substrate temperature below 100◦C during deposition. RMS roughness of≈3.3 nm was measured on the deposited YSZ films by AFM. X-ray pole figures were conducted for texture analysis; in-plane texture measured from YSZ (111) φ-scan FWHM was 13.2℃ and out-of-plane texture from the YSZ (002) ω-scan FWHM was 7.7℃. An≈10 nm thick CeO2 buffer layer was deposited on the YSZ film at 800℃ before YBCO films were ablated by pulsed laser deposition at 780℃ in a 250 mTorr flowing oxygen environment. Good in-plane texture with FWHM≈7℃was observed in YBCO films. Tc=90K, with sharp transition, and transport Jc of≈2.2 ×106 A cm−2 were observed in a 0.5μm thick, 5mmwide, and 1cm long sample at 77K in self-field.

Highly textured MgO films were grown by the inclined-substrate deposition (ISD) technique at a high deposition rate. A columnar grain with a roofing-tile-shaped surface was observed in these MgO films. X-ray pole figure, and/-and x-scan were used to characterize in-plane and out-of-plane textures. MgO films deposited when the incline angle a was 55 and 30 exhibited the best in-plane and out-of-plane texture, respectively. High-quality YBCO films were epitaxially grown on ISD-MgO-buffered Hastelloy C substrates by pulsed laser deposition. Tc/88K, with sharp transition, and jc values of 2105 A/cm2 at 77K in zero field were observed on films 5mm wide and 1cm long. This work has demonstrated that biaxially textured ISD MgO buffer layers deposited on metal substrates are excellent candidates for fabrication of high-quality YBCO coated conductors.

Although pulsed laser deposition (PLD) is one of the most reliable techniques for fabricating YBa2Cu30x (YBCO) thin films with high critical current density (Jc), metal organic decomposition (MOD), inchding the trifluoroacetate (TFA) process, is attracting more interest because of its potential for scale-up and cost-effectiveness. In general, PLD samples have higher Jc values than those of TFA samples. In this study, we deposited YBCO films on LaAIO3 single-crystal substrates by TFA and PLD, respectively. Performance of the two samples was compared to investigate possible causes that lead to the different Jc values. In-plane and out-of-plane texture was evaluated quantitatively by phi and omega scan, respectively. The FWHMs of phi and omega scans for the TFA sample were comparable to those of the PLD sample, indicating that TFA films follow the substrate texture precisely. Raman spectra were measured to estimate grain connectivity, texture, and second-phase formation. The properties of the samples are almost identical, except for the intensity of the BaCuO2 Raman peaks. Microstructure observation by SEM showed that TFA films were generally more porous and smaller-grained than PLD samples. Considering these results, the difference in Jc values between TFA and PLD samples (1.3 and 3MA/cm2, respectively) in this experiment is partly attributed to the more porous mi-crostructure of the TFA samples.

Ni50Mo50合金样品是由纯晶态的Ni和Mo粉末混合，用机械合盘化法制备的国。用中子衍射技术对该样品的非晶化过程进行了研究，观测到了非晶的Ni-Mo的存在，得到了其径向分布函数RDF(r)和一些结构参数。讨论了非晶化的机理，并指出了机械合金化的三种非品化反应类型的划分具有某种局限性。